The surface flatness represents a major application for the Ondulo technology and its ability to measure all the range of surface areas in few seconds.
From rolling mill industry, special glasses and vitro-ceramic, microelectronics and silicon wafer, to all flat surfaces, SurFlat identifies and characterizes with accuracy the localized defects and the surface flatness.
- Measurement in-line and off-line of production.
- Characterization in altitude, curvature and I-Units.
- Acquisition time: 2 sec.
- Automatic identification of the defects.
- Statistical analysis and alarm levels setting.
- 2D and 3D dimensional analysis.
- Frequency analysis of the defects.
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