Application > Calibration
Benchmark with a nano profilometer system.
Topography measurement: defects with an amplitude of 0.4 microns and 5 microns.
Benchmark of the Ondulo measurement with a nano profilometer Taylor Hobson certified by COFRAC, the French Accreditation Committee.
Ondulo Calibration 1 :
Benchmark with a CNC-controlled CMM system.
Measurement of a defect with an amplitude of 40 microns.
Benchmark of the Ondulo measurement with a CNC-controlled CMM machine from Mitutoyo, certified COFRAC, the French Accreditation Committee.Ondulo Calibration 2 :
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